


Instrumentation
JEOL JSM5310 Scanning Electron Microscope
JEM 1200XII Transmission Electron Microcsope
FEI Tacnai Scanning Transmission Electron Microscope
RMC Product's-PowerTome PC-CRX Ultramictrome
Polarized Light Microscopes - Phase Contrast
Atomic Force Microscopy Instrumentation
AFM-CP, AFM Explorer, AFM Autoprobe M5 under the direction of Dr. Mark Foster
Digital Instrument's Nanoscope AFM under the direction of Dr. Stephen Cheng
